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JTAG programming software
Boundary Scan JTAG

boundary-scan memory

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Standard Features:

BSDL Library
Schematic Debug
» Visual Fault Analysis
» Timing Diagram
» TCL Scripting Language

Tests & Programming
Scan Path Test
Interconnect Pin Fault
Memory Test
» FLASH Programming
» ScanWorks®

Analog Instrument
VISA Instrument Control
GPIB IEEE 488 Control

1149.1/.6 Interconnect
Interconnect Diagnostics
Vector Translator
C++ and Libraries
LabView/TestStand VI
Network Licensing

WGL Vector Support
Simulation Interface

Hardware Options:

UltraTAP JTAG Controller
PT100Pro Production Tester
PT100 Multiport JTAG
RCT Benchtop Tester
Digilent HS2-JTAG
Intel/Altera ByteBlaster
Xilinx USB Cable II

» Eclipse Brochure

» Eclipse Family Overview
» Test Development
» Manufacturing Test
» Diagnostics and Repair

Boundary-Scan Test for memory interconnects

Memory Test Overview

To produce high-quality products that employ memory devices it requires that each individual memory's interface - address, data, and control pins - be thoroughly tested during production PCB test. Manually developing high-coverage tests that verify the proper connection of address, data and control signals is a tedious and error prone process. This fact has driven many OEMs to test memories on PCBs from adjacent boundary-scan devices.

Memory Interconnect Test

Automated Boundary-Scan Test for Memory Interconnect with Eclipse

Intellitech's Eclipse Test Development Environment provides automatic test generation for shorts and opens tests to memory devices through boundary-scan. The Eclipse Test Development Environment automatically creates tests that detect pin faults for a wide range of memory types. Key to proper diagnostics, Intellitech's proprietary memory test algorithms pin point opens and shorts faults other "galloping ones" or "marching ones" tests miss.  .

Proprietary Boundary-Scan to Memory Test Algorithms

The Eclipse Test Development environment is unique in the industry. Eclipse employs proprietary test generation algorithms that can test for shorts, stuck-at and opens pin connections. Other 1149.1 based tool vendors use simple walking '1' and '0' data patterns to test memory interconnect. Testing and accurately diagnosing open pins on a memory's address lines can be challenging due to the unpredictability of the behavior a memory that has a faulty connection. In many instances, the open pin is impacted by activity on adjacent pins that can cause it to float high or low. The proprietary memory interconnect test algorithms in Eclipse are able to accurately detect and diagnose open connections on memory address and data lines.

Accurate Diagnostics

The Eclipse Test Development Environment uses an EDIF 2 0 0 netlist from the CAD development system. This enables Eclipse to provide more robust diagnostics when a memory test fails. For each failure, Eclipse will display the failing component and pins, their corresponding net names and the boundary-scan pins where the failure can be observed.

Eclipse Status Window Displaying an Open Fault on a Memory Data Line

Using an EDIF netlist also permits Eclipse to perform constraint checking on pins so that when an engineer is debugging a memory failure with the Schematic Logic ProbeTM (SLPTM) they will not inadvertently set conflicting states on bi-directional or tri-state structures and damage their memory devices.

Extensive Model Library

The Eclipse Test Development Environment has a large library of memory components that describe how each device is written to and read from - read and write protocols. The standard Eclipse library includes device models from AMD, Atmel, Catalyst, Cypress, Fujitsu, Intel, Macronix, Microchip, Micron, SST, ST, Toshiba, Xicor.

Eclipse Memory Test Features

  • No special software package is required, the standard Eclipse Test Development Environment supports automatic memory interconnect testing
  • Memory tests can run directly from the Eclipse Test Development Environment GUI or can be scripted for easy repeatability in a production PCB test environment
  • Highly automated system, the user does not need to specify low level details such as memory write/read protocol or 1149.1 scan sequencing to create and apply memory interconnect tests
  • Eclipse Test Development Environment provides interactive features such as single step -- to help verify and debug basic memory operations
  • Unique algorithm assures that DRAM refresh times are met
  • Superior fault diagnosis tools - enhanced pin fault report, SLP and Visual AnalyzerTM (VFATM)
  • Upload and download memory data to and from a file
  • High coverage tests for data and address pin stuck-at faults, control pin faults, open faults on address pins and bridging faults on address and data pins