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» Scan Exec Brochure

» Eclipse Family Overview
» Test Development
» Manufacturing Test
» Diagnostics and Repair

Standard Features:

» Test Execution
» Test Flow Control
» Diagnostics
» Debug
» Data Logging
» Supervisor Controls
» ScanWorks®

Optional Capabilities:

» Advanced Diagnostics
» C++ and Libraries

» Network Licensing
» Labview Interface

Hardware Options:

» PT100
» JAF Pro
» UltraTAP
» PCI ScanLab

Boundary Scan Test Software

Boundary Scan for Production: ScanExecutiveTM is a Flexible and Easy-to-Use Production Test Environment for Complex PCBs with Boundary Scan.

Eclipse ScanExecutive is a Production PCB Test platform that enables production personnel to execute PCB test programs in a manufacturing environment using a variety of cost-effective IEEE 1149.1 test hardware solutions. Using ScanExecutive supervisors, technicians and operators can easily apply IC to IC infrastructure tests, IC to memory interconnect tests, non-boundary scan cluster tests, FPGA /CPLD configuration suites, and program FLASH memories in-system without in-depth knowledge of IEEE 1149.1.  With the PT100 Parallel Tester option, ScanExecutive can easily keep up with shrinking production cycle times for even the longest test and on-board programming times (See Concurrent JTAG)

ScanExecutive has been designed so that tests developed using the EclipseTM Test Development Environment - Scan Path Integrity Test (SPIT), Virtual Interconnect Test (VIT), FLASH programming, CPLD programming and Virtual Component Cluster Test (VCCT) can be seamlessly applied to a Unit Under Test (UUT) in predefined flows that are controlled with ScanExecutive's flexible Scripting language based on industry standard TCL/TK. Intellitech enables you to merge JTAG tests with GPIB/VISA and USB Instruments wtihout adding the cost of an additional runtime such as Labview or HP VEE.

     "High quality board and system test, and effective board and system debug, are essential in ensuring the reliability and availability of Sun Microsystem's products. Intellitech's Eclipse and scan-based test is critical to meeting this goal. Sun has used, and is continuing to use, Eclipse on products ranging from processor modules to Enterprise servers. We have found Eclipse from Intellitech to be a flexible, cost effective test solution, which is deployed throughout Sun Microsystems as a part of Sun's test process."     
Scott Davidson
Manager DFT Technology
Sun Microsystems
     Digital PCB tests pin faults BGA diagnostics at-speed tests

ScanExecutive Test Application

ScanExecutive applies test data to a Unit Under Test (UUT) based on the information contained in a single (.tst) file. The test engineer creates this .tst file in advance and supplies it with information such as the location and name of the Eclipse database, DUT options file, and ScanExecutive Scripting Language (SSL) file(s) and optionally, any debug files for using Visual Fault AnalyzerTM (VFATM) and Schematic Logic ProbeTM (SLPTM).

ScanExecutive GUI Increases the Throughput and Efficiency of the Manufacturing test Process

The ScanExecutive GUI enables operators to apply tests in a controlled and uniform manner. The ScanExecutive graphical user interface contains pre-programmed buttons for commonly used commands to load and run tests, setup the DUT, configure the test controller and debug failures. These facilities permit operators and technicians to uniformly apply tests and resolve failures with a single mouse click using the same utilities that were used during test development.

At the conclusion of a test, the ScanExecutive Test Status Window will display the UUT's serial number, its lot type, the begin/end time of the test as well as diagnostic output. Diagnostics are presented in the standard Eclipse Pinfault diagnostic format, which displays failures to the device pin level for each Serial Vector Format (SVF) file that has been applied to the UUT. In addition, all ScanExecutive output could be directed to a file or printer.

Intellitech's Integrated Test Flow

Design Engineers use the Eclipse Test Development Environment to create, debug and validate their in-system CPLD, FPGA and FLASH configuration and programming suites. Test Engineers use the Eclipse Board Interconnect Test (BIT) ATPG engine to automatically generate 100% pin-level fault coverage for IC-to-IC and IC-to Memory interconnects. Both design and test engineers can resolve problems using one of the Eclipse debug utilities -- Eclipse Spreadsheet Window, the Eclipse Timing Diagram Analyzer, Schematic Logic Probe or Visual Fault Analyzer. Once the configuration and test suites have been validated, they are passed to the ScanExecutive Production Test Station for execution. Boundary Scan Development

ScanExecutive Requirements

ScanExecutive software is available for Microsoft Windows 98/NT/ME/2000/XP and Sun Solaris 9. ScanExecutive can be licensed as node locked or floating and uses Globetrotter FLEXlm software.

Eclipse ScanExecutive Production Test Station Feature Set

  • Intuitive GUI simplifies the application of test data in high-volume manufacturing flows
  • ScanExecutive's scripting language lowers the cost of test development by eliminating the need of C++ development
  • ScanExecutive supports numerous hardware test application alternatives
  • Multiple executing modes prevent unintentional test setup and program changes
  • Optionally debug test failures in production using SLP and VFA
  • Administrative login mode to control user program privileges allows supervisors to maximize productivity.
  • User Level sensitive scripting allows test engineers to write scripts that display information appropriate to the experience of user
  • Optional PT100 Parallel Tester enables industry's lowest cost test for 1149.1 compliant PCBs

     "Placing pads for test based on physical access is no longer an option for us; it increases PCB layout time and decreases routing efficiency.  Intellitech's boundary-scan technology allows us to continue to get high digital test fault coverage without test pads."     
Zack Matisis
Chief Engineer
LTX Corporation