Production PCB Combinational TesterThe JAF Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a timeThe JAF Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces. Miniaturization makes traditional test point access to both digital and analog nets difficult or impossible. |
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The JAF Pro is targeted for small, low power PCBs that have one or more ARM® based processors. ARM based processors make up about 75% of all 32 bit processors sold and exist in 95% of all cell phones. The manufacturing volumes in this category of PCBs prohibit single boundary-scan or single emulation controller approaches to test. Functional Test through ARM® emulation portThe JAF Pro enables concurrent JTAG tests (all tests run simultaneously in hardware) and concurrent functional tests (through the CPU’s JTAG emulation port) using Intellitech’s patented CJTAG technique. Mixed signal measurements and stimulus are provided by the tester’s built in PXI instrumentation rack. The JAF Pro’s at-speed functional test for ARM based cores adds a capability not found on in-circuit testers. In-circuit testers don’t understand the internal ARM core workings in order to facilitate at-speed processor based tests. Intellitech’s ‘one-pass’ concurrent test gives you simultaneous test results, simultaneous diagnostics without the need to re-run tests on failing UUTs. Watch the video of the PT100 Pro here:PCB Test Video |
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ScanExecutive Software tracks all testing results by serial number |
The JAF Pro is the winner of Best in Test Honorable Mention Award for 2008 from the editors of Test and Measurement World |
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